DLF 1200

The Discovery Laser Flash DLF 1200 employs a custom Class 1 Nd:Glass Laser pulse source to provide a collimated, monochromatic energy pulse with a 300 μs to 400 μs pulse width. Ideal for labs that need to measure thermal diffusivity, heat capacity or thermal conductivity at temperatures up to 1200°C, or require the power of a laser in a compact benchtop instrument.

Equipped with a liquid nitrogen-cooled IR detector, DLF 1200 provides high precision, quick response, non-contact measurements in air, inert gas or vacuum to 10-3 torr. Simple to operate and safe to use, easy to maintain and very economical to operate, these systems are suitable for research and development programs, as well as quality control.

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DXF 900

The Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 900 produces a pulse width of 400 μs to 600 μs and uniformly concentrates the power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.

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DXF 500

The Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 500 produces a pulse width of 400 μs to 600 μs and uniformly concentrates the power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.

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DXF 200+

The Discovery Xenon Flash DXF 200 employs a High Speed Xenon-pulse Delivery source (HSXD) with considerably lower cost and less maintenance than a laser and generates equivalent results. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 200 produces a pulse width that is shorter (400 μs to 600 μs) than many commercial laser-based systems, while uniformly concentrating sufficient power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.

Details