Dynamic Mechanical Analysis (DMA) True axial DMA capability in bending, tension, and compression. Description Features Applications Axial Bending, Tension and Compression With its unique Force Rebalance Transducer (FRT), the ARES-G2 rheometer is the only rotational rheometer capable of performing linear Dynamic Mechanical Analysis (DMA) on solids in bending, tension and compression. Axial sample deformation is…
DetailsFrom plastic for medical devices to rubber for tires, the materials we use must meet increasingly high demands. Product manufacturers and consumers expect their materials to look good, perform well, and cost less, all while being environmentally friendly. Fulfilling all these expectations requires deep understanding of material behavior from the molecular level to real world mechanical properties. Since there are many factors that affect the properties of materials, precise measurement tools and methods are required to ensure that materials fulfill the high expectations of our world. A key measurement and analysis method to evaluate the properties of materials at various stages of development and production is Dynamic Mechanical Analysis (DMA).
DetailsDynamic Mechanical Analysis (DMA) The DMA Mode adds a new dimension for testing of solid and soft-solid materials. Description Technology Specifications & Features Applications Dynamic Mechanical Analysis (DMA) Backed by over four decades of TA Instruments’ expertise in rotational rheology and linear DMA measurements, the Discovery Hybrid Rheometer’s DMA Mode adds a new dimension for…
DetailsDynamic Mechanical Analysis (DMA) The DMA Mode adds a new dimension for testing of solid and soft-solid materials. Description Technology Specifications & Features Applications Dynamic Mechanical Analysis (DMA) Backed by over four decades of TA Instruments’ expertise in rotational rheology and linear DMA measurements, the Discovery Hybrid Rheometer’s DMA Mode adds a new dimension for…
DetailsThe Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 900 produces a pulse width of 400 μs to 600 μs and uniformly concentrates the power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.
DetailsThe Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 500 produces a pulse width of 400 μs to 600 μs and uniformly concentrates the power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.
DetailsThe Discovery Xenon Flash DXF 200 employs a High Speed Xenon-pulse Delivery source (HSXD) with considerably lower cost and less maintenance than a laser and generates equivalent results. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 200 produces a pulse width that is shorter (400 μs to 600 μs) than many commercial laser-based systems, while uniformly concentrating sufficient power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.
DetailsDual Stage Peltier Plate Perfect choice for applications requiring sub-ambient temperature control. Description Features Technology Accessories Complete Peltier Plate Temperature Systems Over 20 years ago, TA Instruments first introduced Peltier Plate temperature control to rheometers. Since then, this core technology has been continuously developed and adapted to meet the expanding needs of our customers. With…
DetailsDual Cantilever Installation & Calibration – DMA 850 In this TA Techtip, we show you how to install and calibrate the dual cantilever clamp for the new Discovery DMA 850 from TA Instruments
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